Carbon nanotube interconnects: Electrical characterization of 150 nm CNT contacts with Cu damascene top contact
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M. H. van der Veen | G. Groeseneken | C. Huyghebaert | Z. Tokei | P. Vereecken | D. Cott | B. Vereecke | N. Chiodarelli
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M. H. van der Veen | G. Groeseneken | C. Huyghebaert | Z. Tokei | P. Vereecken | D. Cott | B. Vereecke | N. Chiodarelli