Characterization of asymmetric graded-index planar optical waveguides from the knowledge of TE/sub 0/-TE/sub 1/ mode cutoff wavelengths

The authors have proposed (1991) a simple method for predicting the index profile parameter (the profile exponent q in case of a power law profile or the aspect ratio S in case of trapezoidal index profile) of a graded-index optical fiber which is single moded in the 1.3-1.55 mu m wavelength range from a measurement of the LP/sub 11/ and LP/sub 02/ cutoff wavelengths. They extend the method with appropriate modification to determine the asymmetry parameter sigma , the maximum refractive index n/sub f/ and the characteristic thickness d of the guiding layer of a few-moded graded-index asymmetric planar optical waveguide from a measurement of the TE/sub 0/ and TE/sub 1/ cutoff wavelengths. The method is simple and can give firsthand information about these parameters with reasonably good accuracy.<<ETX>>

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