Optimal Design of Accelerated Life Tests for One-shot Devices

Accelerated life test of One-shot devices has been a complicated subject for analysis due to its high reliability and destructiveness in the test. Due to its characteristics in the test, the achievement of failure data is difficult for prediction and analysis for reliability. Bayesian optimal design can provide enough information regarding the reliability while optimization of test design can occur with smaller sample size and test duration compare to previous optimal design methods. While the budget is fixed, application of lifetime distribution such as exponential and Weibull distribution is applied and comparative study will be performed to observe the difference of optimality criterion as well as experimental design. Also, comparative study of optimal design between reliable parameter estimation and inaccurate estimation will be performed.

[1]  Luis A. Escobar,et al.  A Review of Recent Research and Current Issues in Accelerated Testing , 1993 .

[2]  Narayanaswamy Balakrishnan,et al.  Optimal Step-Stress Accelerated Degradation Test Plan for Gamma Degradation Processes , 2009, IEEE Transactions on Reliability.

[3]  Hon Yiu So,et al.  Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing , 2016, IEEE Transactions on Reliability.

[4]  Narayanaswamy Balakrishnan,et al.  EM algorithm for one-shot device testing under the exponential distribution , 2012, Comput. Stat. Data Anal..

[5]  J. H. Seo,et al.  Design of accelerated life test sampling plans with a nonconstant shape parameter , 2009, Eur. J. Oper. Res..

[6]  Tsai-Hung Fan,et al.  The Bayesian approach for highly reliable electro-explosive devices using one-shot device testing , 2009 .

[7]  Man Ho Ling,et al.  Optimal design of simple step-stress accelerated life tests for one-shot devices under Weibull distributions , 2020, Reliab. Eng. Syst. Saf..

[8]  Reema Sharma,et al.  A hierarchical Bayes analysis for one-shot device testing experiment under the assumption of exponentiality , 2018, Commun. Stat. Simul. Comput..

[9]  Narayanaswamy Balakrishnan,et al.  Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution , 2014, IEEE Transactions on Reliability.

[10]  Narayanaswamy Balakrishnan,et al.  Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution , 2012, IEEE Transactions on Reliability.

[11]  Elsayed A. Elsayed,et al.  Optimal design of proportional hazards based accelerated life testing plans , 2002 .