A comparison of scanning methods and the vertical control implications for scanning probe microscopy
暂无分享,去创建一个
[1] M.V. Salapaka,et al. Scanning Probe Microscopy , 2008, IEEE Control Systems.
[2] D. Croft,et al. Creep, Hysteresis, and Vibration Compensation for Piezoactuators: Atomic Force Microscopy Application , 2001 .
[3] Andrew J. Fleming,et al. Dual-Stage Vertical Feedback for High-Speed Scanning Probe Microscopy , 2011, IEEE Transactions on Control Systems Technology.
[4] C. Gerber,et al. Surface Studies by Scanning Tunneling Microscopy , 1982 .
[5] J. R. Carson. Notes on the Theory of Modulation , 1922, Proceedings of the Institute of Radio Engineers.
[6] Santosh Devasia,et al. A Survey of Control Issues in Nanopositioning , 2007, IEEE Transactions on Control Systems Technology.
[7] Theodore Antonakopoulos,et al. Nanopositioning using the spiral of Archimedes: The probe-based storage case , 2010 .
[8] Santosh Devasia,et al. Image-based compensation of dynamic effects in scanning tunnelling microscopes , 2005 .
[9] Karl Johan Åström,et al. Design and Modeling of a High-Speed AFM-Scanner , 2007, IEEE Transactions on Control Systems Technology.
[10] Ian R. Petersen,et al. Spiral scanning of atomic force microscope for faster imaging , 2013, 52nd IEEE Conference on Decision and Control.
[11] Bharath Bhikkaji,et al. A New Scanning Method for Fast Atomic Force Microscopy , 2011, IEEE Transactions on Nanotechnology.
[12] Andrew J. Fleming,et al. A simplified method for discrete-time repetitive control using model-less finite impulse response filter inversion | NOVA. The University of Newcastle's Digital Repository , 2016 .
[13] S. O. Reza Moheimani,et al. Tracking of spiral trajectories beyond scanner resonance frequency by a MEMS nanopositioner , 2015, 2015 IEEE Conference on Control Applications (CCA).
[14] Santosh Devasia,et al. Feedback-Linearized Inverse Feedforward for Creep, Hysteresis, and Vibration Compensation in AFM Piezoactuators , 2007, IEEE Transactions on Control Systems Technology.
[15] Ian R. Petersen,et al. High-precision spiral positioning control of a piezoelectric tube scanner used in an atomic force microscope , 2014, 2014 American Control Conference.
[16] Ricardo Garcia,et al. Dynamic atomic force microscopy methods , 2002 .
[17] Shao-Kang Hung,et al. Spiral scanning method for atomic force microscopy. , 2010, Journal of nanoscience and nanotechnology.
[18] Yuen Kuan Yong,et al. Design, Identification, and Control of a Flexure-Based XY Stage for Fast Nanoscale Positioning , 2009, IEEE Transactions on Nanotechnology.
[19] I. Petersen,et al. Robust H ∞ Control in Fast Atomic Force Microscopy , 2013 .
[20] L. Guvenc,et al. Robust Repetitive Controller for Fast AFM Imaging , 2011, IEEE Transactions on Nanotechnology.
[21] Andrew J. Fleming,et al. High‐speed serial‐kinematic SPM scanner: design and drive considerations , 2009 .
[22] Yik Ren Teo,et al. A new repetitive control scheme based on non-causal FIR filters , 2014, 2014 American Control Conference.
[23] J. Lygeros,et al. High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories , 2012, Nanotechnology.
[24] S. O. Reza Moheimani,et al. Video-Rate Lissajous-Scan Atomic Force Microscopy , 2014, IEEE Transactions on Nanotechnology.
[25] Gerber,et al. Atomic Force Microscope , 2020, Definitions.
[26] Daniel Y. Abramovitch,et al. A comparison of control architectures for atomic force microscopes , 2009 .
[27] S O Reza Moheimani,et al. High-speed Lissajous-scan atomic force microscopy: scan pattern planning and control design issues. , 2012, The Review of scientific instruments.
[28] Jan Tommy Gravdahl,et al. Discrete-time repetitive control with model-less FIR filter inversion for high performance nanopositioning , 2014, 2014 IEEE/ASME International Conference on Advanced Intelligent Mechatronics.
[29] K. Leang,et al. Design and Control of a Three-Axis Serial-Kinematic High-Bandwidth Nanopositioner , 2012, IEEE/ASME Transactions on Mechatronics.
[30] M. Abramowitz,et al. Handbook of Mathematical Functions With Formulas, Graphs and Mathematical Tables (National Bureau of Standards Applied Mathematics Series No. 55) , 1965 .
[31] William Singhose,et al. Robust Negative Input Shapers for Vibration Suppression , 2009 .
[32] S O R Moheimani,et al. High-speed cycloid-scan atomic force microscopy , 2010, Nanotechnology.
[33] Li-Chen Fu,et al. Sinusoidal trajectory for atomic force microscopy precision local scanning with auxiliary optical microscopy , 2013, 52nd IEEE Conference on Decision and Control.
[34] Krzysztof Patan. Iterative Learning Control , 2019 .
[35] T. Ando. Control techniques in high-speed atomic force microscopy , 2008, 2008 American Control Conference.
[36] I. A. Mahmood,et al. Fast spiral-scan atomic force microscopy , 2009, Nanotechnology.
[37] Qingze Zou,et al. A review of feedforward control approaches in nanopositioning for high-speed spm , 2009 .
[38] Andrew J. Fleming,et al. Optimal Periodic Trajectories for Band-Limited Systems , 2009, IEEE Transactions on Control Systems Technology.
[39] S. Hara,et al. Repetitive control system: a new type servo system for periodic exogenous signals , 1988 .
[40] D. Croft,et al. Creep, hysteresis, and vibration compensation for piezoactuators: atomic force microscopy application , 2000, Proceedings of the 2000 American Control Conference. ACC (IEEE Cat. No.00CH36334).
[41] M. S. Rana,et al. LQG controller with sinusoidal reference signal modeling for spiral scanning of atomic force microscope , 2013, 2013 IEEE 8th Conference on Industrial Electronics and Applications (ICIEA).
[42] A. Fleming,et al. Bridging the gap between conventional and video-speed scanning probe microscopes. , 2010, Ultramicroscopy.
[43] D.Y. Abramovitch,et al. A Survey of Non-Raster Scan Methods with Application to Atomic Force Microscopy , 2007, 2007 American Control Conference.