论文信息 - Issues related to the formulation of DFT solution for analog circuit test using equivalent fault analysis

Issues related to the formulation of DFT solution for analog circuit test using equivalent fault analysis

This paper identifies a few important points at which the application of equivalent fault analysis becomes the preferred choice in formulating a DFT solution for analog circuit test. These issues are important in that the test and/or design engineer should be aware of them in order to come up with effective test solutions to enhance fault diagnosis.

Mike W. T. Wong

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