Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile
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David Flores | Salvador Hidalgo | Jesús Urresti-Ibañez | J. Rebollo | Ignasi Cortés | Jaume Roig | D. Flores | S. Hidalgo | J. Rebollo | J. Roig | J. Urresti-Ibañez | I. Cortés
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