A mixed-signal built-in self-test approach for analog circuits

A built-in self-test (BIST) approach is described which is designed to test the analog portion of mixed-signal integrated circuits and systems. The BIST circuitry is located in the digital portion of the mixed-signal circuitry to minimize area overhead and effects on the analog portion of the mixed-signal system. The approach was evaluated using benchmark circuits for analog testing and found to consistently provide fault coverage greater than 95%, even when acceptable component parameter variations are added to the set of benchmark circuits.

[1]  Charles E. Stroud,et al.  Digital components for built-in self-test of analog circuits , 1997, Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334).

[2]  Jacob A. Abraham,et al.  Analog Testing with Time Response Parameters , 1996, IEEE Des. Test Comput..

[3]  José Luis Huertas,et al.  Analog and mixed-signal benchmark circuits-first release , 1997, Proceedings International Test Conference 1997.

[4]  Charles E. Stroud,et al.  Benchmark circuits for analog and mixed-signal testing , 1999, Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300).

[5]  Charles E. Stroud.  A Designer's Guide to Built-In Self-Test , 2002 .

[6]  Abhijit Chatterjee,et al.  DC Built-In Self-Test for Linear Analog Circuits , 1996, IEEE Des. Test Comput..

[7]  Charles E. Stroud,et al.  Built-in self-test for analog circuits in mixed-signal systems , 1999, Proceedings IEEE Southeastcon'99. Technology on the Brink of 2000 (Cat. No.99CH36300).

[8]  Gordon W. Roberts,et al.  An Introduction to Mixed-Signal IC Test and Measurement , 2000 .