High-resolution x-ray diffraction studies of highly curved GaN layers prepared by hydride vapor phase epitaxy
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J. Q. Liu | Y. X. Qiu | J. F. Wang | X. Guo | K. Huang | K. Xu | H. Yang | Y. Qiu | H. Yang | J. Liu | J. F. Wang | K. Huang | X. Guo | K. Xu
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