Preparation and characterization of some tin oxide films

Tin oxide films were successfully prepared by the reactive evaporation method with a d.c. glow discharge of oxygen. The structure and composition of the films were characterized by Mossbauer spectroscopy, X-ray diffraction and scanning electron microscopy. The valency of tin atoms in the films determined by Mossbauer spectroscopy is mostly divalent in the samples prepared without discharge, but mostly tetravalent in the samples prepared with discharge. Measurements of electrical conductivity and Hall mobility were also carried out and the data were found to correlate with the concentration ratio [Sn4+]/[Sn2+] determined from Mossbauer spectroscopy.

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