Near-field nonlinear automatic test method for multi-light-emitting-unit semiconductor laser, and device thereof

The invention provides a near-field nonlinear automatic test method for a multi-light-emitting-unit semiconductor laser, and a device thereof. Automatic identification is performed on chamber surface light spots of a semiconductor laser. Reference light exists as feedback determining light for determining and realizing fine adjustment, thereby improving near-field nonlinear accuracy of the multi-light-emitting-unit semiconductor laser. The near-field nonlinear automatic test method has high automatic degree and reduces errors caused by manual operation. According to the near-field nonlinear automatic test method, the reference light exists as the feedback determining light, and therefore automatic identification for the chamber surface light spots of the semiconductor laser can be realized, and furthermore determination can be performed for realizing accurate adjustment. The near-field nonlinear accuracy of the multi-light-emitting-unit semiconductor laser is improved.