Reduction of Current Collapse in GaN High-Electron Mobility Transistors Using a Repeated Ozone Oxidation and Wet Surface Treatment
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Yilong Hao | Min Yu | Wengang Wu | Kevin J. Chen | Sen Huang | Cheng P. Wen | Maojun Wang | Bo Shen | Bing Xie | Jinyan Wang | Shuxun Lin
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