论文信息 - Latch-up characterization of semicustom using ATE

Latch-up characterization of semicustom using ATE

An ATE approach for latch-up static test is proposed that allows a quick and complete characterization of devices even with a very high pin count. The software tool is described and some results presented.<<ETX>>

S. Gaviraghi

[1] B. L. Gregory,et al. Latch-Up in CMOS Integrated Circuits , 1973 .

[2] Ronald R. Troutman. Latchup in CMOS Technology , 1986 .

[3] C. Canali,et al. Correlation between anomalous latch-up I/V characteristics and observation of current distribution by IR microscopy in CMOS ICs , 1988 .