论文信息 - Interactions Between Thick Film Resistors And Alumina Substrate

Interactions Between Thick Film Resistors And Alumina Substrate

Interactions upon firing of Ru-based thick film resistor(TFR) pastes with alumina substrate have been investigated intensively using various m icroana I yt i ca I means. vitreous contents of TFRs and alumina, formations of Ru-free glass layer and occasional crystalline phase have been disclosed in the bot tom layer of TFRs. The crystalline phase has been identified to be the variation within the plagioclase (Ca,Pb)Si2Als0, family. Growth rate o f the glass layer is shown to be controlled by a diffusional process, and the effects of the reactions on various TFR properties are signified. In addition to the mutual diffusion between

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