Simplified empirical formula on TSV thermal analysis for 3D IC EDA
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Ligang Hou | Bo Lu | Jinhui Wang | Jingyan Fu
[1] Madhavan Swaminathan,et al. Polarization mode basis functions for modeling insulator-coated through-silicon via (TSV) interconnections , 2009, 2009 IEEE Workshop on Signal Propagation on Interconnects.
[2] Eby G. Friedman,et al. Interconnect-Based Design Methodologies for Three-Dimensional Integrated Circuits , 2009, Proceedings of the IEEE.
[3] Jason Cong,et al. Three-Dimensional Integrated Circuit Design: EDA, Design and Microarchitectures , 2009 .
[4] Jae-Hyun Park,et al. The electrical, mechanical properties of through-silicon-via insulation layer for 3D ICs , 2009, 2009 International Conference on Electronic Packaging Technology & High Density Packaging.
[5] Yiyu Shi,et al. The Effects of Substrate Doping Density on The Electrical Performance of Through-Silicon-Via ( TSV ) , 2011 .
[6] Madhavan Swaminathan,et al. Electrical modeling of Through Silicon and Package Vias , 2009, 2009 IEEE International Conference on 3D System Integration.
[7] M. Ozisik. Heat Transfer: A Basic Approach , 1984 .
[8] Albert E. Ruehli,et al. Capacitance calculation for a shared-antipad via structure using an integral equation method based on partial capacitance , 2011, 2011 IEEE 20th Conference on Electrical Performance of Electronic Packaging and Systems.
[9] Eby G. Friedman,et al. Three-dimensional Integrated Circuit Design , 2008 .