In-Process Improvement through Defect Data Interpretation

An approach that involves both automatic and human interpretation to correct the software production process during development is becoming important in IBM as a means to improve quality and productivity. A key step of the approach is the interpretation of defect data by the project team. This paper uses examples of such correction to evaluate and evolve the approach, and to inform and teach those who will use the approach in software development. The methodology is shown to benefit different kinds of projects beyond what can be achieved by current practices, and the collection of examples discussed represents the experiences of using a model of correction.

[1]  G. A. Miller THE PSYCHOLOGICAL REVIEW THE MAGICAL NUMBER SEVEN, PLUS OR MINUS TWO: SOME LIMITS ON OUR CAPACITY FOR PROCESSING INFORMATION 1 , 1956 .

[2]  Inderpal S. Bhandari,et al.  Post-process feedback with and without attribute focusing: a comparative evaluation , 1993, Proceedings of 1993 15th International Conference on Software Engineering.

[3]  Watts S. Humphrey,et al.  Managing the software process , 1989, The SEI series in software engineering.

[4]  William Frawley,et al.  Knowledge Discovery in Databases , 1991 .

[5]  Carole L. Jones A Process-Integrated Approach to Defect Prevention , 1985, IBM Syst. J..

[6]  Victor R. Basili,et al.  Paradigms for experimentation and empirical studies in software engineering , 1991 .

[7]  John D. Musa,et al.  Software reliability - measurement, prediction, application , 1987, McGraw-Hill series in software engineering and technology.

[8]  Robert G. Mays,et al.  Experiences with Defect Prevention , 1990, IBM Syst. J..

[9]  Ram Chillarege,et al.  Reliability Growth for Typed Defects , 1992 .

[10]  Inderpal S. Bhandari,et al.  In-Process Evaluation for Software Inspection and Test , 1993, IEEE Trans. Software Eng..

[11]  Robert B. Grady,et al.  Software Metrics: Establishing a Company-Wide Program , 1987 .

[12]  Ram Chillarege,et al.  Defect type and its impact on the growth curve (software development) , 1991, [1991 Proceedings] 13th International Conference on Software Engineering.

[13]  Amrit L. Goel,et al.  Software Reliability Models: Assumptions, Limitations, and Applicability , 1985, IEEE Transactions on Software Engineering.

[14]  Inderpal Bhandari,et al.  Attribute focusing: machine-assisted knowledge discovery applied to software production process control , 1993 .

[15]  Adam A. Porter,et al.  Learning from Examples: Generation and Evaluation of Decision Trees for Software Resource Analysis , 1988, IEEE Trans. Software Eng..

[16]  Inderpal S. Bhandari,et al.  Orthogonal Defect Classification - A Concept for In-Process Measurements , 1992, IEEE Trans. Software Eng..

[17]  Gregory Piatetsky-Shapiro,et al.  Knowledge Discovery in Databases: An Overview , 1992, AI Mag..

[18]  A. Ram Knowledge Goals : A Theory of Interestingness Ashwin , 1990 .