Feature Selection based on the Bhattacharyya Distance

This paper presents a Bhattacharyya distance based feature selection method, which utilizes a recursive algorithm to obtain the optimal dimension reduction matrix in terms of the minimum upper bound of classification error under normal distribution for multi-class classification problem. In our scheme, PCA is incorporated as a pre-processing to reduce the intractably heavy computation burden of the recursive algorithm. The superior experimental results on the handwritten-digit recognition with the MNIST database and the steganalysis applications have demonstrated the effectiveness of our proposed method.

[1]  Kari Torkkola,et al.  Discriminative features for text document classification , 2003, Formal Pattern Analysis & Applications.

[2]  Chengyun Yang,et al.  Steganalysis Based on Multiple Features Formed by Statistical Moments of Wavelet Characteristic Functions , 2005, Information Hiding.

[3]  Chulhee Lee,et al.  Feature extraction based on the Bhattacharyya distance , 2003, Pattern Recognit..

[4]  Keinosuke Fukunaga,et al.  Introduction to Statistical Pattern Recognition , 1972 .

[5]  David G. Stork,et al.  Pattern Classification , 1973 .

[6]  X. Guorong,et al.  Bhattacharyya distance feature selection , 1996, Proceedings of 13th International Conference on Pattern Recognition.

[7]  David G. Stork,et al.  Pattern classification, 2nd Edition , 2000 .