Synchrotron radiation infrared microscopic study of non-bridging oxygen modes associated with laser-induced breakdown of fused silica

Nanosecond pulse laser-driven optical breakdown at SiO2 surfaces as probed by synchrotron-based Fourier transform infrared (SRFTIR) and photoluminescence (PL) microscopies is presented. SRFTIR mapping of laser damage identified localized non-bridging Si-O vibrational modes at ∼950 cm−1 which became stiffer as 355 nm laser pulse lengths were increased from 5 to 20 ns. The bridging Si-O-Si transverse optic mode frequency varied significantly across damaged regions indicating a wide range of average bond angles, softening slightly with increasing pulse length. 355 nm-excited PL images of laser modified regions could be directly correlated with the structural modifications identified through SRFTIR.

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