Electrostatic Screening of Charged Defects in Monolayer MoS2.
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J. Hone | L. Brus | X. Zhu | T. Atallah | R. Burke | D. Seo | J. Wang | M. Bosch | M. Theibault | O. Moneer | Justin Zhu
暂无分享,去创建一个
J. Hone | L. Brus | X. Zhu | T. Atallah | R. Burke | D. Seo | J. Wang | M. Bosch | M. Theibault | O. Moneer | Justin Zhu