Built-In Self-Test: Assuring System Integrity

Today's complex electronic products are harder to test using traditional external methods. Built in self test can frequently be used without significantly increasing a product's size, cost and production time.

[1]  Hong Hao,et al.  Structured design-for-debug-the SuperSPARC II methodology and implementation , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

[2]  Saman Adham,et al.  Linking diagnostic software to hardware self test in telecom systems , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

[3]  Kenneth P. Parker.  The Boundary-Scan Handbook , 1992, Springer US.

[4]  A. J. van de Goor,et al.  Testing Semiconductor Memories: Theory and Practice , 1998 .

[5]  Rodham E. Tulloss.  Leave the wires to last-functional evaluation of the IEEE Std 1149.5 module test and maintenance bus , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

[6]  Jacob Savir,et al.  Built In Test for VLSI: Pseudorandom Techniques , 1987 .

[7]  Stephen K. Sunter,et al.  The P1149.4 Mixed Signal Test Bus: costs and benefits , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).

[8]  Eric Lindbloom,et al.  Structured Logic Testing , 1990 .

[9]  Edward C. Behnke.  3B21D BIST/Boundary-Scan system diagnostic test story , 1994, Proceedings., International Test Conference.