ADC testing methods

The present paper begins by highlighting some difficulties encountered in the application of the testing algorithms described in the recent IEEE Std. 1241 DRAFT to commercial ADCs designed for audio application. In the experienced case study, the inaccurate knowledge of the DUT sampling rate made it unusable in the aforementioned testing algorithms. Hence, the paper describes in detail a new robust algorithm of sine wave best fitting that overcomes this drawback. A commercial, low price ADC designed for audio application has then been used as DUT for the proposed algorithm and the obtained results are discussed from the viewpoint of IEEE Std. 1241. Finally, a procedure to enhance the fitting capability of the algorithm is presented as well.

[1]  Philippe Marchegay,et al.  A/D converter characterization by spectral analysis in "Dual-Tone" mode , 1995 .

[2]  Ryszard Malewski,et al.  Comparative evaluation of computer methods for calculating the best-fit sinusoid to the digital record of a high-purity sine wave , 1987, IEEE Transactions on Instrumentation and Measurement.

[3]  Y.-C. Jenq.  High-precision sinusoidal frequency estimator based on weighted least square method , 1987, IEEE Transactions on Instrumentation and Measurement.

[4]  Gerd Vandersteen,et al.  A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter , 1996 .

[5]  Rik Pintelon,et al.  An improved sine-wave fitting procedure for characterizing data acquisition channels , 1995 .

[6]  Andrzej Pacut,et al.  Generalized model of the quantization error-a unified approach , 1996 .

[7]  Bruce E. Peetz.  Dynamic Testing of Waveform Recorders , 1983, IEEE Transactions on Instrumentation and Measurement.

[8]  J. Kuffel,et al.  A comparative evaluation of some practical algorithms used in the equivalent bits test of waveform recorders , 1988 .

[9]  J. Blair.  Histogram measurement of ADC nonlinearities using sine waves , 1994 .

[10]  J.P. Deyst,et al.  Sounds on least-squares four-parameter sine-fit errors due to harmonic distortion and noise , 1994, Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9).