Proton Radiation Test Results on COTS-Based Electronic Devices for NASA-Johnson Space Center Spaceflight Projects

This paper reports the results of recent single event effect (SEE) testing on a variety of commercial-off-the-shelf (COTS) based microelectronic hardware after exposure to 200 Mega-electron-volt (MeV) protons. This hardware was being evaluated for use in both Space Shuttle and International Space Station (ISS) applications. Our approach, test protocol and analysis methodology are discussed

[1]  M.D. Berg,et al.  Compendium of Recent Single Event Effects Results for Candidate Spacecraft Electronics for NASA , 2008, 2008 IEEE Radiation Effects Data Workshop.

[2]  T. Rinckel,et al.  Beam properties of the new radiation effects research stations at Indiana University Cyclotron Facility , 2004, 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774).

[3]  Charles E Ebeling,et al.  An Introduction to Reliability and Maintainability Engineering , 1996 .

[4]  G. Badhwar,et al.  Galactic cosmic radiation model and its applications. , 1996, Advances in space research : the official journal of the Committee on Space Research.

[5]  E. L. Petersen,et al.  The SEU figure of merit and proton upset rate calculations , 1998 .

[6]  C.C. Foster,et al.  Monte Carlo Simulation of Proton Upsets in Xilinx Virtex-II FPGA Using a Position Dependent ${\rm Q}_{\rm crit}$ With PROPSET , 2006, IEEE Transactions on Nuclear Science.

[7]  G. Badhwar,et al.  Internuclear cascade-evaporation model for LET spectra of 200 MeV protons used for parts testing. , 1998, IEEE transactions on nuclear science.

[8]  James H. Adams,et al.  Cosmic Ray Effects on Microelectronics. Part 4 , 1986 .

[9]  Gautam D. Badhwar,et al.  Time Lag of Twenty Two Year Solar Modulation , 1993 .

[10]  H.S. Kim,et al.  Single event effects results for candidate spacecraft electronics for NASA , 2003, 2003 IEEE Radiation Effects Data Workshop.

[11]  J. I. Vette,et al.  AP-8 trapped proton environment for solar maximum and solar minimum. [Computer accessible models , 1976 .

[12]  E. L. Petersen,et al.  Proton Upsets in Orbit , 1983, IEEE Transactions on Nuclear Science.

[13]  R.A. Reed,et al.  Current single event effects results for candidate spacecraft electronics for NASA , 2004, 2004 IEEE Radiation Effects Data Workshop (IEEE Cat. No.04TH8774).