Microstructure and dislocation of epitaxial InN films revealed by high resolution x-ray diffraction
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P. Han | W. Schaff | R. Zhang | Youliao Zheng | Z. Xie | X. Xiu | B. Liu | Ping-Zen Chen | Yue-chun Shi | Yongchao Li | H. Lu | Q. Liu | Z. Zhang | S. Gu