Design Review Of A Complete Angle Scatter Instrument

An instrument has been designed and built to measure plane of incidence scatter at multiple wavelengths including .6328μm, from reflective, transmissive, specular, diffuse, flat and curved optics. An extensive software package accompanies the instrument and is used both to control the measurement process and to analyze the measurement data. Techniques employed in the design and development of this instrument are described. An error analysis for the measured BSDF is provided and calibration of the instrument is discussed.