论文信息 - Measurements of the Depth Profile of the Refractive Indices in Oxide Films on SiC by Spectroscopic Ellipsometry - 字舞流文

Measurements of the Depth Profile of the Refractive Indices in Oxide Films on SiC by Spectroscopic Ellipsometry

Y. Tomioka | Y. Ishida | Y. Hijikata | H. Yaguchi | M. Yoshikawa | T. Iida | M. Midorikawa | H. Itoh | S. Yoshida | Misao Orihara | H. Tukada | K. Yoshimoto