论文信息 - Sweep time, spectral mismatch and light soaking in thin film module measurement

Sweep time, spectral mismatch and light soaking in thin film module measurement

The effect of sweep time, spectrum and light soaking on thin film measurements with a flash simulator are reviewed. Module performance was measured with varying sweep times from less than 1ms to 30ms and a comparison between module performance indoors and outdoors was made. Sweep times longer than 1 ms did not affect the measured performance of CdTe and CIGS modules. A 2% increase in power was observed for a-Si modules. Device performance indoors and outdoors was compared. Very accurate correspondence was observed for CIGS modules as well as double junction a-Si. CdTe modules showed a reasonably good match in terms of maximum power.

Antti Tolvanen | Johannes Kuurne | Jaakko Hyvarinen

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