Differential Extrapolation Method for Separating Dielectric and Rough Conductor Losses in Printed Circuit Boards

Copper foil in printed circuit board (PCB) transmission lines/interconnects is roughened to promote adhesion to dielectric substrates. It is important to characterize PCB substrate dielectrics and correctly separate dielectric and conductor losses, especially as data rates in high-speed digital designs increase. Herein, a differential method is proposed for separating conductor and dielectric losses in PCBs with rough conductors. This approach requires at least three transmission lines with identical, or at least as close as technologically possible, basic geometry parameters of signal trace, distance-to-ground planes, and dielectric properties, while the average peak-to-valley amplitude of surface roughness of the conductor would be different. The peak-to-valley amplitude of conductor roughness is determined from scanning electron microscopy images.

[1]  Quan Chen,et al.  New simulation methodology of 3D surface roughness loss for interconnects modeling , 2009, 2009 Design, Automation & Test in Europe Conference & Exhibition.

[2]  Xiaoxiong Gu,et al.  Off-Chip Rough-Metal-Surface Propagation Loss Modeling and Correlation with Measurements , 2007, 2007 Proceedings 57th Electronic Components and Technology Conference.

[4]  Giulio Antonini,et al.  PLANAR TRANSMISSION LINE METHOD FOR CHARACTERIZATION OF PRINTED CIRCUIT BOARD DIELECTRICS , 2010 .

[5]  A. Deutsch,et al.  Prediction of Losses Caused by Roughness of Metallization in Printed-Circuit Boards , 2007, IEEE Transactions on Advanced Packaging.

[6]  Oszkar Biro,et al.  Parameters of lossy cavity resonators calculated by the finite element method , 1996 .

[7]  T.-M. Winkel,et al.  Extraction of /spl epsiv//sub r/(f) and tan/spl delta/(f) for printed circuit board insulators up to 30 GHz using the short-pulse propagation technique , 2005, IEEE Transactions on Advanced Packaging.

[8]  Franz J. Giessibl,et al.  Advances in atomic force microscopy , 2003, cond-mat/0305119.

[9]  Gerard V. Kopcsay,et al.  and for Printed Circuit Board Insulators Up to 30 GHz Using the Short-Pulse Propagation Technique , 2005 .

[10]  Effect of Surface Roughness on Propagation of the TEM Mode , 1971 .

[12]  G. Goubau Surface Waves and Their Application to Transmission Lines , 1950 .

[13]  Xiaoxiong Gu,et al.  Modeling Effects of Random Rough Interface on Power Absorption Between Dielectric and Conductive Medium in 3-D Problem , 2007, IEEE Transactions on Microwave Theory and Techniques.

[14]  S. Morgan,et al.  Effect of Surface Roughness on Eddy Current Losses at Microwave Frequencies , 1949 .

[15]  Andreas C. Cangellaris,et al.  Investigation of the impact of conductor surface roughness on interconnect frequency-dependent ohmic loss , 2003, 53rd Electronic Components and Technology Conference, 2003. Proceedings..

[16]  S.G. Pytel,et al.  Multigigahertz Causal Transmission Line Modeling Methodology Using a 3-D Hemispherical Surface Roughness Approach , 2007, IEEE Transactions on Microwave Theory and Techniques.

[17]  T. Sarkar,et al.  Wideband frequency-domain characterization of FR-4 and time-domain causality , 2001, IEEE Transactions on Electromagnetic Compatibility.

[18]  James L. Drewniak,et al.  Improved technique for extracting parameters of low-loss dielectrics on printed circuit boards , 2009, 2009 IEEE International Symposium on Electromagnetic Compatibility.

[19]  R. Weigel,et al.  High resolution time domain and frequency domain package characterization up to 65 GHz , 2006, 56th Electronic Components and Technology Conference 2006.

[20]  Quan Chen,et al.  Robust Simulation Methodology for Surface-Roughness Loss in Interconnect and Package Modelings , 2009, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[21]  Ngai Wong,et al.  An efficient stochastic integral equation method for modeling the influence of conductor surface roughness on interconnect ohmic loss , 2007, 2007 50th Midwest Symposium on Circuits and Systems.

[22]  James L. Drewniak,et al.  Effect of Conductor Surface Roughness upon Measured Loss and Extracted Values of PCB Laminate Material Dissipation Factor , 2009 .

[23]  E. Degarmo Materials and Processes in Manufacturing , 1974 .

[24]  Brice Achkir,et al.  Material parameter extraction using Time-Domain TRL (t-TRL) measurements , 2009, 2009 IEEE International Symposium on Electromagnetic Compatibility.

[25]  Tao Liang,et al.  Non-Classical Conductor Losses due to Copper Foil Roughness and Treatment , 2005 .

[26]  D. Pozar Microwave Engineering , 1990 .