Temporal differential CMOS image sensor for low-light and high-speed applications

A new structure of pixels of CMOS image sensors is presented in this article. With multiple layers of metal, it is possible to separate control pins of adjacent pixels. These separated control pins make it possible to overlap exposure time of these pixels. After recovering information with temporal difference from the raw data of overlapping exposure, the temporal resolution can be smaller than the exposure time. This kind of pixels can be used in low-light or high-speed applications where the choices of exposure time is limited.