Thorium dioxide thin films in the extreme ultraviolet
暂无分享,去创建一个
David D. Allred | R. Steven Turley | Nicole Brimhall | Amy B. Grigg | R. S. Turley | D. Allred | N. Brimhall
[1] Eberhard Spiller,et al. Soft-x-ray optics , 1994, Optical Society of America Annual Meeting.
[2] Larry V. Knight,et al. Image Quality Of Figured Multilayered Optics , 1985, Optics & Photonics.
[3] L. G. Parratt. Surface Studies of Solids by Total Reflection of X-Rays , 1954 .
[4] B. L. Henke,et al. X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92 , 1993 .
[5] Eric M. Gullikson,et al. Recent developments in EUV reflectometry at the Advanced Light Source , 2001, SPIE Advanced Lithography.
[6] V. V. Kondratenko,et al. Efficient method for the determination of extreme-ultraviolet optical constants in reactive materials: application to scandium and titanium. , 2004, Journal of the Optical Society of America. A, Optics, image science, and vision.
[7] David D. Allred,et al. Determining ruthenium's optical constants in the spectral range 11-14 nm , 2004, SPIE Optics + Photonics.
[8] R. S. Turley,et al. Thorium-Based Thin Films as Highly Reflective Mirrors in the EUV , 2005 .
[9] V. G. Kohn,et al. On the Theory of Reflectivity by an X-Ray Multilayer Mirror , 1995 .
[10] David D. Allred,et al. Optical properties and application of uranium-based thin films for the extreme ultraviolet and soft x-ray region , 2004, SPIE Optics + Photonics.