论文信息 - Characterization of the a-CdTe:O ternary compound grown by RF sputtering

Characterization of the a-CdTe:O ternary compound grown by RF sputtering

The authors study the evolution of a-CdTe:O samples with thermal annealing using XRD, RS, AES and ESCA techniques. The final compound mixture is quantified. All results obtained agree with the Cd-Te-O ternary phase diagram.

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