Compact-2D: A Physical Design Methodology to Build Commercial-Quality Face-to-Face-Bonded 3D ICs
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[1] Sung Kyu Lim,et al. Design and CAD methodologies for low power gate-level monolithic 3D ICs , 2014, 2014 IEEE/ACM International Symposium on Low Power Electronics and Design (ISLPED).
[2] Eric Beyne,et al. The 3-D Interconnect Technology Landscape , 2016, IEEE Design & Test.
[3] Sung Kyu Lim,et al. How much cost reduction justifies the adoption of monolithic 3D ICs at 7nm node? , 2016, 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
[4] Sung Kyu Lim,et al. Cascade2D: A design-aware partitioning approach to monolithic 3D IC with 2D commercial tools , 2016, 2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
[5] Tadatomo Suga,et al. Direct Cu to Cu Bonding and Other Alternative Bonding Techniques in 3D Packaging , 2017 .
[6] Eric Beyne,et al. Ultra-Fine Pitch 3D Integration Using Face-to-Face Hybrid Wafer Bonding Combined with a Via-Middle Through-Silicon-Via Process , 2016, 2016 IEEE 66th Electronic Components and Technology Conference (ECTC).
[7] S. Ramanathan,et al. Three-dimensional wafer stacking via Cu-Cu bonding integrated with 65-nm strained-Si/low-k CMOS technology , 2006, IEEE Electron Device Letters.
[8] J. Lau,et al. A novel, wafer-level stacking method for low-chip yield and non-uniform, chip-size wafers for MEMS and 3D SIP applications , 2008, 2008 58th Electronic Components and Technology Conference.
[9] Hsien-Hsin S. Lee,et al. Design and Analysis of 3D-MAPS (3D Massively Parallel Processor with Stacked Memory) , 2015, IEEE Transactions on Computers.
[10] Diederik Verkest,et al. Physical Design Solutions to Tackle FEOL/BEOL Degradation in Gate-level Monolithic 3D ICs , 2016, ISLPED.