Mass production of p-type Cz silicon solar cells approaching average stable conversion efficiencies of 22 %

Abstract Within this work, both the performance and reliability of industrial p -type monocrystalline solar cells with dielectrically passivated rear side and corresponding modules are investigated. Results of the mass production of Q.ANTUM solar cells at Hanwha Q CELLS on boron-doped p -type Czochralski-grown silicon (Cz-Si) substrates are presented, exceeding 21.5 % average conversion efficiency. Without power-enhancing measures such as the use of half cells, multi-wire approaches or light-capturing ribbons, essentially all currently (as of March 2017) produced Cz-Si Q.ANTUM solar modules exhibit output powers of > 300 Wp with 60 full 4-busbar cells. In terms of reliability, light-induced degradation (LID) is investigated in detail, with conditions relevant for the activation of, both, the boron-oxygen (BO) defect, and, so-called “Light and Elevated Temperature Induced Degradation” (LeTID). While the formation of the BO defect has been considered the most prominent LID mechanism in boron-doped p -type Cz-Si, LeTID has so far been discussed mainly as a potential issue for passivated emitter and rear cells (PERC) on multicrystalline silicon (mc-Si) substrates. This work shows that, if not adequately suppressed, LeTID can also occur in p -type Cz-Si PERC with a degradation in output power of up to > 6 %, which cannot be suppressed in a straightforward manner by conventional processing steps to permanently deactivate the BO defect. In contrast to conventional PERC, Hanwha Q CELLS’ Q.ANTUM technology is shown to reliably suppress, both, LID due to BO defect formation, and , LeTID in modules manufactured from, both, p -type mc-Si and Cz-Si substrates.