Gaussianity evaluation of noise in RuO2-glass resistors
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P. Szałański | Andrzej Kolek | A. W. Stadler | K. Mleczko | Z. Zawiślak | P. Ptak | D. Żak
[1] John H. Scofield,et al. ac method for measuring low‐frequency resistance fluctuation spectra , 1987 .