论文信息 - Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling - 字舞流文

Understanding the ISPP Slope in Charge Trap Flash Memory and its Impact on 3-D NAND Scaling

M. Rosmeulen | G. Rzepa | F. Schanovsky | O. Baumgartner | M. Karner | D. Verreck | A. Arreghini | G. Van den bosch | C. Kernstock | Z. Stanojevic | F. Mitterbauer