Investigations of dislocation strain fields using weak beams

Abstract A method for determining the position of dislocation lines accurately from dislocation images is reported and applied to the case of measuring the separation of partial dislocations. A theoretical analysis of the method is given, and the predictions verified by many-beam computed image profiles. The separation of partial dislocations in Cu + 10at. % Al has been determined using the method. The separation was found to be 120±20 A. Other applications of the method are suggested.

[1]  A. Howie,et al.  Electron Microscopy of Thin Crystals , 1977, Nature.

[2]  A. Howie,et al.  Approximations of the dynamical theory of diffraction contrast , 1968 .

[3]  L. M. Brown.  The self-stress of dislocations and the shape of extended nodes , 1964 .

[4]  R. Gevers.  On the kinematical theory of diffraction contrast of electron transmission microscope images of perfect and partial screw dislocations , 1963 .

[5]  M. Whelan,et al.  Diffraction contrast of electron microscope images of crystal lattice defects. III. Results and experimental confirmation of the dynamical theory of dislocation image contrast , 1962, Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences.

[6]  R. Gevers.  On the kinematical theory of diffraction contrast of electron transmission microscope images of perfect dislocations of mixed type , 1962 .

[7]  M. Whelan,et al.  A kinematical theory of diffraction contrast of electron transmission microscope images of dislocations and other defects , 1960, Philosophical Transactions of the Royal Society of London. Series A, Mathematical and Physical Sciences.

[8]  R. Gevers.  On the kinematical theory of diffraction contrast of electron transmission microscope images of edge dislocations , 1962 .

[9]  M. Whelan.  Dislocation interactions in face-centred cubic metals, with particular reference to stainless steel , 1959, Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences.