Optimal design of multiple stresses accelerated life test plan based on transforming the multiple stresses to single stress

For planning optimum multiple stresses accelerated life test plans, a commonly followed guiding principle is that all parameters of the life-stress relationship should be estimated, and the number of the stress level combinations must be no less than the number of parameters of the life-stress relationship. However, the general objective of an accelerated life test(ALT) is to assess the p-th quantile of the product life distribution under normal stress. For this objective, estimating all model parameters is not necessary, and this will increase the cost of test. Based on the theoretical conclusion that the stress level combinations of the optimum multiple stresses ALT plan locate on a straight line through the origin of coordinate, it is proposed that a design idea of planning the optimum multiple stresses ALT plan through transforming the problem of designing an optimum multiple stresses ALT plan to designing an optimum single stress ALT plan. Moreover, a method of planning the optimum multiple stresses ALT plan which can avoid estimating all model parameters is established. An example shows that, the proposed plan which only has two stress level combinations could achieve an accuracy no less than the traditional plan, and save the test time and cost on one stress level combination at least; when the actual product life is less than the design value, even the deviation of the model initial parameters value is up to 20%, the variance of the estimation of the p-th quantile of the proposed plan is still smaller than the traditional plans approximately 25%. A design method is provided for planning the optimum multiple stresses ALT which uses the statistical optimum degenerate test plan as the optimum multiple stresses accelerated life test plan.

[1]  Francis G. Pascual,et al.  Lognormal and Weibull accelerated life test plans under distribution misspecification , 2005, IEEE Transactions on Reliability.

[2]  William Q. Meeker,et al.  Planning accelerated life tests with two or more experimental factors , 1995 .

[3]  K. Chaloner,et al.  Bayesian design for accelerated life testing , 1992 .

[4]  Francis G. Pascual,et al.  Accelerated Life Test Plans Robust to Misspecification of the Stress—Life Relationship , 2006, Technometrics.

[5]  B. Yum,et al.  Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution , 1991 .

[6]  Josep Ginebra,et al.  Minimax approach to accelerated life tests , 1998 .

[7]  William Q. Meeker,et al.  Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions , 1978 .

[8]  Guangbin Yang,et al.  Accelerated life tests at higher usage rates , 2005, IEEE Trans. Reliab..

[9]  Gao,et al.  Accelerated Degradation Reliability Modeling and Test Data Statistical Analysis of Aerospace Electrical Connector , 2011 .

[10]  Wenhua Chen,et al.  Step-stress accelerated degradation test modeling and statistical analysis methods , 2013 .

[11]  Yonggang Lin TWO MODEL SWICHED PREDICTIVE PITCH CONTROL FOR WIND TURBINE BASED ON SUPPORT VECTOR REGRESSION , 2006 .

[12]  Liang Gao,et al.  Optimal design of multiple stress constant accelerated life test plan on non-rectangle test region , 2012 .

[13]  Loon Ching Tang,et al.  Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor , 2010 .

[14]  Thomas M. Cover,et al.  Elements of Information Theory , 2005 .

[15]  Loon Ching Tang,et al.  Planning and Inference for a Sequential Accelerated Life Test , 2010 .

[16]  William Q. Meeker,et al.  Optimum Accelerated Life Tests Wth a Nonconstant Scale Parameter , 1994 .

[17]  Thomas J. Kielpinski,et al.  Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions , 1975, IEEE Transactions on Reliability.

[18]  William Q. Meeker,et al.  Optimum Accelerated Life-Tests for the Weibull and Extreme Value Distributions , 1975, IEEE Transactions on Reliability.

[19]  Bong-Jin Yum,et al.  OPTIMAL-DESIGN OF ACCELERATED LIFE TESTS UNDER PERIODIC INSPECTION , 1989 .

[20]  Loon Ching Tang,et al.  Planning accelerated life tests with three constant stress levels , 2002 .

[21]  Herman Chernoff,et al.  Optimal Accelerated Life Designs for Estimation , 1962 .

[22]  N. Ahmad,et al.  Optimal accelerated life test designs for Burr type XII distributions under periodic inspection and type I censoring , 1996 .

[23]  Islam,et al.  Optimal design of accelerated life test plans under periodic inspection and type I censoring: The case of Rayleigh failure law , 1994 .

[24]  Chen Wenhua,et al.  THEORY & METHOD FOR OPTIMUM DESIGN OF ACCELERATED LIFE TEST PLAN UNDER MULTIPLE STRESSES , 2006 .

[25]  Francis Pascual,et al.  On minimax designs when there are two candidate models , 2002 .

[26]  Francis G. Pascual,et al.  Model-Robust Test Plans With Applications in Accelerated Life Testing , 2003, Technometrics.

[27]  Guang-Bin Yang,et al.  Optimum constant-stress accelerated life-test plans , 1994 .

[28]  Wayne Nelson,et al.  Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions , 1975 .

[29]  Ping Qian,et al.  Design criteria for planning multiple stresses accelerated life test , 2011, The Proceedings of 2011 9th International Conference on Reliability, Maintainability and Safety.

[30]  Bong-Jin Yum,et al.  Optimal design of accelerated life tests with two stresses , 1996 .

[31]  W. Meeker A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring , 1984 .