Single event effects on hard-by-design latches

Chip with four kinds of hard-by-design latches and an unhardened one is fabricated with a commercial 0.18 mum process, and tested for their SEL and SEU susceptibility. Some of the latches are tested with heavy-ions for the first time. Simulation and test results prove that the hardening methods we used are very effective. Discussions and comparisons are made among test results.

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