Measured surface locating and matching method in free-form surface subaperture splicing interference detection

The invention discloses a measured surface locating and matching method in free-form surface subaperture splicing interference detection. The method comprises three parts of free-form surface rotating matching, free-form surface axial initial locating and free-form surface pose error precision matching. Free-form surface rotating matching mainly utilizes moire fringes for locating; free-form surface axial initial locating mainly utilizes a continuous measurement out-of-focus curve matching method; and free-form surface pose error precision matching mainly utilizes a forward calculation method that full-aperture pose error is calculated by utilizing the subaperture wave-front coefficient and then the model pose is corrected. Therefore, consistent matching of the free-form surface model and the actual free-form surface pose is realized. The actual mechanical adjustment process is avoided and the process is enabled to be close to the experiment by adjusting the pose of the system model so that finally locating and matching of the model and the measured surface of the actual experiment can be guaranteed.