Symbol error correcting codes for memory applications

Symbol error correcting codes have been used for fault tolerance in computer memory subsystems configured in b-bits-per-chip. This paper presents algorithms for designing the parity check matrices of symbol error correcting codes to reduce circuit count and the circuit time delay. It presents a technique for formulating the parity check matrices for modular implementation. It also presents codes that use a smaller number of circuits and require a shorter circuit delay time than other known codes. These results are useful for practical design of symbol error correcting codes.

[1]  Chin-Long Chen,et al.  Error-Correcting Codes for Semiconductor Memory Applications: A State-of-the-Art Review , 1984, IBM J. Res. Dev..

[2]  E. J. Weldon,et al.  Some Results on Quasi-Cyclic Codes , 1969, Inf. Control..

[3]  Eiji Fujiwara,et al.  Single Byte Error Correcting—Double Byte Error Detecting Codes for Memory Systems , 1982, IEEE Transactions on Computers.

[4]  J. Wolf Adding two information symbols to certain nonbinary BCH codes and some applications , 1969 .

[5]  R. Chien,et al.  Error-Correcting Codes, Second Edition , 1973, IEEE Transactions on Communications.

[6]  Chin-Long Chen,et al.  Error-correcting codes for byte-organized memory systems , 1986, IEEE Trans. Inf. Theory.

[7]  C. L. Chen,et al.  Fault-tolerant memory design in the IBM application system/400 , 1991, [1991] Digest of Papers. Fault-Tolerant Computing: The Twenty-First International Symposium.