36 Topics in measurement selection
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[1] B. Chandrasekaran,et al. Comments on "On the mean accuracy of statistical pattern recognizers" by Hughes, G. F , 1969, IEEE Trans. Inf. Theory.
[2] Thomas M. Cover,et al. The Best Two Independent Measurements Are Not the Two Best , 1974, IEEE Trans. Syst. Man Cybern..
[3] Jan M. Van Campenhout,et al. On the Possible Orderings in the Measurement Selection Problem , 1977, IEEE Transactions on Systems, Man, and Cybernetics.
[4] Richard O. Duda,et al. Pattern classification and scene analysis , 1974, A Wiley-Interscience publication.
[5] Godfried T. Toussaint,et al. Comments on 'A modified figure of merit for feature selection in pattern recognition' by Paul, J. E., Jr., et al , 1971, IEEE Trans. Inf. Theory.
[6] Laveen N. Kanal,et al. Patterns in pattern recognition: 1968-1974 , 1974, IEEE Trans. Inf. Theory.
[7] Godfried T. Toussaint,et al. Note on optimal selection of independent binary-valued features for pattern recognition (Corresp.) , 1971, IEEE Trans. Inf. Theory.
[8] J. V. Campenhout. The arbitrary relation between probability of error and measurement subset , 1980 .
[9] G. F. Hughes,et al. On the mean accuracy of statistical pattern recognizers , 1968, IEEE Trans. Inf. Theory.
[10] C. H. Chen,et al. On a class of computationally efficient feature selection criteria , 1975, Pattern Recognit..
[11] Keinosuke Fukunaga,et al. A Branch and Bound Algorithm for Feature Subset Selection , 1977, IEEE Transactions on Computers.
[12] M. Kendall,et al. The discarding of variables in multivariate analysis. , 1967, Biometrika.
[13] Anil K. Jain,et al. MEAN RECOGNITION ACCURACY OF DEPENDENT BINARY MEASUREMENTS. , 1977 .