论文信息 - Josephson-based test bench for ac characterization of analog-to-digital converters

Josephson-based test bench for ac characterization of analog-to-digital converters

To perform systematic characterization of high resolution analog-to-digital converters (ADC), a test bench based on a 1 V programmable Josephson voltage standard (PJVS) has been developed. The PJVS generates different waveforms used as references which are sampled by the digitizer under test. As a first and preliminary example, the integral nonlinearity of a commercial 24-bits delta-sigma converter has been measured. It was found to be smaller than 4 µV/V at a frequency of 16 Hz on its 1 V range.

A. Rufenacht | F. Overney | B. Jeanneret | J.-P. Braun

[1] Luis Palafox,et al. Design and Characterization of a Sampling System Based on $\Sigma$–$\Delta$ Analog-to-Digital Converters for Electrical Metrology , 2009, IEEE Transactions on Instrumentation and Measurement.

[2] E. Mohns,et al. Characterization of a High-Resolution Analog-to-Digital Converter with an Ac Josephson Voltage Source , 2004, 2004 Conference on Precision Electromagnetic Measurements.

[3] Luca Callegaro,et al. Josephson-Voltage-Standard-Locked Sine Wave Synthesizer: Margin Evaluation and Stability , 2009, IEEE Transactions on Instrumentation and Measurement.

[4] B. Jeanneret,et al. Application of the Josephson effect in electrical metrology , 2009 .

[5] Ralf Behr,et al. Characterization of a high-resolution analog-to-digital converter with a Josephson AC voltage source , 2005, IEEE Transactions on Instrumentation and Measurement.