Phonon-Drag Effect on Seebeck Coefficient in Co-Doped Si Wire with Submicrometer-Scaled Cross Section
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Yuhei Suzuki | Faiz Salleh | Yoshinari Kamakura | Masaru Shimomura | Hiroya Ikeda | Hiroya Ikeda | Yuhei Suzuki | Y. Kamakura | H. Ikeda | M. Shimomura | F. Salleh | Yuhei Suzuki
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