Exact thermal representation of multilayer rectangular structures by infinite plate structures using the method of images

Using the method of images and the analytical temperature solution to the multilayer infinite plate structure, the thermal profile over finite rectangular multilayer integrated circuit devices can be calculated exactly. The advantage of using the image method lies in the enhanced capability of arriving at an analytical solution for structures where analytical solutions do not apparently exist, e.g., circular or arbitrarily oriented rectangular sources over multilayered rectangular structures. The new approach results in large savings in computer CPU time especially for small sources over large substrates. The method also finds very important applications to integrated circuit devices with heat dissipating elements close to the edge boundaries. Results from two examples indicate that the edge boundaries of a device may also be utilized to remove heat from it. This additional heat removing capability should have important applications in high power devices.

[1]  F. T. Wenthen,et al.  Computer-aided thermal analysis of power semiconductor devices , 1970 .

[2]  W. Joyce,et al.  Thermal resistance of heterostructure lasers , 1975 .

[3]  Rinaldo Castello,et al.  Integrated-circuit thermal modeling , 1978 .

[4]  A. L. Palisoc,et al.  Thermal analysis of solid-state devices using the boundary element method , 1988 .

[5]  Carlos Alberto Brebbia,et al.  Topics in Boundary Element Research , 1985 .

[6]  L. Mahalingam,et al.  Thermal Studies on Pin Grid Array Packages for High Density LSI and VLSI Logic Circuits , 1983 .

[7]  G. Ellison The Thermal Design of an LSI Single-Chip Package , 1976 .

[8]  V. Hein Convection and conduction cooling of substrates containing multiple heat sources , 1967 .

[9]  R. Hannemann,et al.  Electronic System Thermal Design for Reliability , 1977, IEEE Transactions on Reliability.

[10]  C. Brebbia,et al.  Boundary Elements IX , 1987 .

[11]  Gene K. Baxter,et al.  High Temperature Thermal Characteristics of Microelectronic Packages , 1977 .

[12]  David P. Kennedy,et al.  Spreading Resistance in Cylindrical Semiconductor Devices , 1960 .

[13]  A. G. Kokkas Thermal analysis of multiple-layer structures , 1974 .

[14]  R. D. Lindsted,et al.  Steady-state junction temperatures of semiconductor chips , 1972 .

[15]  A. L. Palisoc,et al.  Thermal properties of the multilayer infinite plate structure , 1988 .

[16]  W. Nakwaski,et al.  Thermal resistance of light-emitting diodes , 1985, IEEE Transactions on Electron Devices.

[17]  S. C. Choo,et al.  The spreading resistance of an inhomogeneous slab with a disc electrode as a mixed boundary value problem , 1979 .

[18]  D. Waller,et al.  Analysis of Surface Mount Thermal and Thermal Stress Performance , 1983 .