Testing Of Analog Systems Using Behavioral Models And Optimal Experimental Design Techniques

This paper describes a new CAD algorithm which performs automatic test pattern generation (ATPG) for a general class of analog systems, namely those circuits which can be efficiently modeled as an additive combination of user-defined basis functions. The algorithm is based on the statistical technique of I-optimal experimental design, in which test vectors are chosen to be maximally independent so that circuit performance will be characterized as accurately as possible in the presence of measurement noise and model inaccuracies. This technique allows analog systems to be characterized more accurately and more efficiently, thereby significantly reducing system test time and hence total manufacturing cost.

[1]  Alberto L. Sangiovanni-Vincentelli,et al.  A behavioral representation for Nyquist rate A/D converters , 1991, 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers.

[2]  Jack Kiefer,et al.  Collected Papers III: Design of Experiments , 1984 .

[3]  Gerard N. Stenbakken,et al.  A comprehensive approach for modeling and testing analog and mixed-signal devices , 1990, Proceedings. International Test Conference 1990.

[4]  G. Box,et al.  Empirical Model-Building and Response Surfaces. , 1990 .

[5]  S. B. Crary.  Optimal design of experiments for sensor calibration , 1991, TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers.

[6]  Michael H. Schulz,et al.  SOCRATES: a highly efficient automatic test pattern generation system , 1988, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[7]  Alberto L. Sangiovanni-Vincentelli,et al.  Minimizing production test time to detect faults in analog circuits , 1994, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[8]  Gerard N. Stenbakken,et al.  Test-point selection and testability measures via QR factorization of linear models , 1987, IEEE Transactions on Instrumentation and Measurement.

[9]  George E. P. Box,et al.  Empirical Model‐Building and Response Surfaces , 1988 .

[10]  J. Ganger,et al.  Test features of the MC145472 ISDN U-transceivers , 1990, Proceedings. International Test Conference 1990.

[11]  R. H. Hardin,et al.  A new approach to the construction of optimal designs , 1993 .

[12]  Gerard N. Stenbakken,et al.  LINEAR ERROR MODELING OF ANALOG AND MIXED-SIGNAL DEVICES , 1991, 1991, Proceedings. International Test Conference.

[13]  Srinivas Devadas,et al.  Sequential Logic Testing and Verification , 1991 .

[14]  T.M. Souders,et al.  Cutting the high cost of testing , 1991, IEEE Spectrum.

[15]  E. Felt,et al.  Analog testability analysis and fault diagnosis using behavioral modeling , 1994, Proceedings of IEEE Custom Integrated Circuits Conference - CICC '94.

[16]  Alan J. Miller,et al.  A review of some exchange algorithms for constructing discrete D-optimal designs , 1992 .

[17]  Robert Hooke,et al.  `` Direct Search'' Solution of Numerical and Statistical Problems , 1961, JACM.