A metric of identification performance of biometrics based on information content

We propose the minimum distance entropy (MDE) as a metric of biométrie information content. The MDE is the probability that two biométrie samples correspond exactly expressed in information content and can be calculated through the experiment for interpersonal matching using a set of biométrie samples. This metric makes it possible for certain biometrics not only to be compared with other biometrics but also to be partially compared with personal authentication using passwords, PIN, or other methods in regard to the identification performance or the security. In this paper, we discuss the metric in terms of information theory and show how to evaluate it. Then, as an example, we apply it to a fingerprint system and evaluate fingerprint information content through simulations.

[1]  Rafail Ostrovsky,et al.  Fuzzy Extractors: How to Generate Strong Keys from Biometrics and Other Noisy Data , 2004, SIAM J. Comput..

[2]  Sang Joon Kim,et al.  A Mathematical Theory of Communication , 2006 .

[3]  John Daugman,et al.  The importance of being random: statistical principles of iris recognition , 2003, Pattern Recognit..

[4]  Madhu Sudan,et al.  A Fuzzy Vault Scheme , 2006, Des. Codes Cryptogr..

[5]  Richard Youmaran,et al.  Towards a measure of biometric feature information , 2009, Pattern Analysis and Applications.

[6]  Anil K. Jain,et al.  Handbook of Fingerprint Recognition , 2005, Springer Professional Computing.

[7]  J. L. Wayman,et al.  Best practices in testing and reporting performance of biometric devices. , 2002 .

[8]  John Daugman,et al.  The importance of being random: statistical principles , 2002 .

[9]  Sharath Pankanti,et al.  On the individuality fingerprints , 2001, Proceedings of the 2001 IEEE Computer Society Conference on Computer Vision and Pattern Recognition. CVPR 2001.

[10]  Nalini K. Ratha,et al.  Enhancing security and privacy in biometrics-based authentication systems , 2001, IBM Syst. J..

[11]  Radford M. Neal Pattern Recognition and Machine Learning , 2007, Technometrics.