Dielectric tensor measurement from a single Mueller matrix image.
暂无分享,去创建一个
[1] R. Chipman. Depolarization index and the average degree of polarization. , 2005, Applied optics.
[2] Tino Hofmann,et al. Generalized ellipsometry of complex mediums in layered systems , 2002, SPIE Optics + Photonics.
[3] Pavel I. Lazarev,et al. Low‐leakage off‐angle in E‐polarizers , 2001 .
[4] P. Varga. Use of confocal microscopes in conoscopy and ellipsometry. 1. Electromagnetic theory. , 2000, Applied optics.
[5] A. En Naciri,et al. Spectroscopic generalized ellipsometry based on fourier analysis. , 1999, Applied optics.
[6] A. En Naciri,et al. Spectroscopic ellipsometry of anisotropic materials: application to the optical constants of HgI2. , 1999, Applied optics.
[7] M. Schubert,et al. BIREFRINGENCE AND REFLECTIVITY OF SINGLE-CRYSTAL CDAL2SE4 BY GENERALIZED ELLIPSOMETRY , 1998 .
[8] Craig M. Herzinger,et al. Characterization of biaxially-stretched plastic films by generalized ellipsometry , 1998 .
[9] G. Jellison,et al. Measurement of the optical functions of uniaxial materials by two-modulator generalized ellipsometry: rutile (TiO(2)). , 1997, Optics letters.
[10] G. Jellison,et al. Two-modulator generalized ellipsometry: experiment and calibration. , 1997, Applied optics.
[11] G. Jellison,et al. Two-modulator generalized ellipsometry: theory. , 1997, Applied optics.
[12] Jr. G.E. Jellison,et al. Spectroscopic ellipsometry data analysis : measured versus calculated quantities , 1997 .
[13] M. Schubert,et al. Anisotropy of boron nitride thin-film reflectivity spectra by generalized ellipsometry , 1997 .
[14] Craig M. Herzinger,et al. Generalized transmission ellipsometry for twisted biaxial dielectric media: Application to chiral liquid crystals , 1996 .
[15] R. Chipman,et al. Interpretation of Mueller matrices based on polar decomposition , 1996 .
[16] Craig M. Herzinger,et al. Extension of rotating-analyzer ellipsometry to generalized ellipsometry: determination of the dielectric function tensor from uniaxial TiO 2 , 1996 .
[17] Schubert,et al. Polarization-dependent optical parameters of arbitrarily anisotropic homogeneous layered systems. , 1996, Physical review. B, Condensed matter.
[18] J. Lekner. Ellipsometry of anisotropic media , 1993 .
[19] D. Goldstein,et al. Mueller matrix dual-rotating retarder polarimeter. , 1992, Applied optics.
[20] Masud Mansuripur,et al. Analysis of multilayer thin-film structures containing magneto-optic and anisotropic media at oblique incidence using 2×2 matrices , 1990 .
[21] Pochi Yeh,et al. Optics of anisotropic layered media: A new 4 × 4 matrix algebra , 1980 .
[22] R. Azzam,et al. Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal. , 1978, Optics letters.
[23] Rasheed M. A. Azzam,et al. A simple Fourier photopolarimeter with rotating polarizer and analyzer for measuring Jones and Mueller matrices , 1978 .
[24] D. W. Berreman,et al. Optics in Stratified and Anisotropic Media: 4×4-Matrix Formulation , 1972 .
[25] M. Schubert,et al. Explicit solutions for the optical properties of arbitrary magneto-optic materials in generalized ellipsometry. , 1999, Applied optics.
[26] M. Haller,et al. Multidomain ellipsometry for thin film process control , 1998 .
[27] William H. Press,et al. Numerical Recipes in C, 2nd Edition , 1992 .