Experimental study of the quasi-breakdown failure mechanism in 4.5 nm-thick SiO2 oxides
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Didier Goguenheim | Dominique Vuillaume | Alain Bravaix | P. Candelier | A. Meinertzhagen | M. Jourdain | P. Candelier | D. Vuillaume | A. Bravaix | M. Jourdain | D. Goguenheim | F. Mondon | F. Mondon | A. Meinertzhagen
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