The Combinatorial Design Approach to Automatic Test Generation

The combinatorial design method substantially reduces testing costs. The authors describe an application in which the method reduced test plan development from one month to less than a week. In several experiments, the method demonstrated good code coverage and fault detection ability.

[1]  Marshall Hall,et al.  Combinatorial Theory: Hall/Combinatorial , 1988 .

[2]  J. R. Horgan,et al.  A data flow coverage testing tool for C , 1992, [1992] Proceedings of the Second Symposium on Assessment of Quality Software Development Tools.

[3]  Joseph Robert Horgan,et al.  Effect of test set size and block coverage on the fault detection effectiveness , 1994, Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering.

[4]  Robert Brownlie,et al.  Robust testing of AT&T PMX/StarMAIL using OATS , 1992, AT&T Technical Journal.

[5]  Paul Piwowarski,et al.  Coverage measurement experience during function test , 1993, Proceedings of 1993 15th International Conference on Software Engineering.

[6]  Joseph Robert Horgan,et al.  Effect of Test Set Minimization on Fault Detection Effectiveness , 1995, 1995 17th International Conference on Software Engineering.

[7]  Colin L. Mallows,et al.  Covering Designs in Random Environments , 1997 .

[8]  Siddhartha R. Dalal,et al.  The Automatic Efficient Test Generator (AETG) system , 1994, Proceedings of 1994 IEEE International Symposium on Software Reliability Engineering.

[9]  Robert Mandl,et al.  Orthogonal Latin squares: an application of experiment design to compiler testing , 1985, CACM.