The Local Structure of the BiS2 Layer in RE(O,F)BiS2 Determined by In-Plane Polarized X-ray Absorption Measurements
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E. Paris | T. Mizokawa | R. Higashinaka | A. Puri | K. Terashima | T. Matsuda | T. Wakita | T. Yokoya | M. Nagao | Y. Aoki | L. Tortora | N. Saini | G. Pugliese