MOSFET threshold voltage: Definition, extraction, and some applications

This paper exploits a universal current-based definition of the threshold voltage (V"T) and discusses some direct methods to measure it. The consistency, accuracy, and sensitivity of the extraction procedures to second-order effects are examined through numerical simulations and experimental measurements. In addition to three procedures based on dc current measurements we propose an automatic V"T-extractor circuit which allows the direct determination of the threshold voltage with minimum influence of second-order effects.