Reliability considerations in accelerated life testing of electrical insulation with generalized life distribution function

The authors introduced a new approach to estimate life distributions at nominal conditions from the results of accelerated life testing of electrical insulating materials. A very general family of probability distributions is introduced, and a best fit member of this family is used to represent life data at each stress level. Nonlinear optimization techniques are applied in conjunction with linear regression analysis. In any accelerated life testing study important questions pertain to the minimal and maximal stress levels to be applied. A method of determination of the minimal stress level as well as the suitable number of tests based on reliability considerations is presented. A numerical example based on test data and a user-friendly computer program are presented. >

[1]  T. W. Dakin,et al.  The voltage endurance of cast epoxy resins , 1978, 1978 IEEE International Conference on Electrical Insulation.

[2]  Stanley E. Kiersztyn Formal Theoretical Foundation of Electrical Aging of Dielectrics , 1981 .

[3]  G. C. Stone,et al.  Application of statistical methods to the design of solid insulation systems , 1985, Conference on Electrical Insulation & Dielectric Phenomena - Annual Report 1985.

[4]  G. Stone,et al.  The Application of Weibull Statistics to Insulation Aging Tests , 1979, IEEE Transactions on Electrical Insulation.

[5]  Wayne Nelson,et al.  Analysis of Accelerated Life Test Data-Least Squares Methods for the Inverse Power Law Model , 1975, IEEE Transactions on Reliability.

[6]  G. C. Stone,et al.  Some Graphical Techniques for Estimating Weibull Confidence Intervals , 1984, IEEE Transactions on Reliability.